Trading Fault-Masking with Performance Overhead for FPGAs

Konferenz: ARCS 2011 - 24th International Conference on Architecture of Computing Systems
22.02.2011 - 23.02.2011 in Como, Italy

Tagungsband: ARCS 2011

Seiten: 4Sprache: EnglischTyp: PDF

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Siozios, Kostas; Soudris, Dimitrios (School of Electrical and Computer Engineering, National Technical University of Athens, Greece)

Reliability issues become an important design concern with technology scaling. This paper introduces a novel methodology for balancing the desired fault masking and the consequence delay and power overheads due to redundancy. Experimental results shown that our solution outperforms similar approaches since it achieves average delay and power savings up to 25% and 35%, respectively, for comparable fault masking to existing commercially available solutions.