A Simplified RF Model to Investigate Impacts of RF Impairments on OFDM
Konferenz: OFDM 2014 - 18th International OFDM Workshop 2014 (InOWo'14)
27.08. - 28.08.2014 in Essen, Deutschland
Seiten: 6Sprache: EnglischTyp: PDFPersönliche VDE-Mitglieder erhalten auf diesen Artikel 10% Rabatt
Gao, Yuan; Kreul, Theo; Kaiser, Thomas (Institute of Digital Signal Processing, University Duisburg-Essen, Duisburg, Germany)
Orthogonal frequency division multiplexing (OFDM) systems are sensitive to RF impairments that should be investigated carefully with an appropriate RF model. In this paper, a simplified RF model is studied, regarding nonlinearity, IQ imbalance, phase noise (PN), carrier frequency offset (CFO), DC offset and noise figure (NF). The simplified RF model has not only low complexity and high flexibility, but also high accuracy by taking into account the coherence between RF impairments.