Reliability Improvement of high Temperature sintered Ag Die-Attachment by adding Sub-micron SiC Particles

Konferenz: PCIM Europe 2015 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
19.05.2015 - 20.05.2015 in Nürnberg, Deutschland

Tagungsband: PCIM Europe 2015

Seiten: 8Sprache: EnglischTyp: PDF

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Autoren:
Zhang, Hao (Division of Adaptive Systems, Graduate School of Engineering, Osaka University, 2 - 1 Yamadaoka, Suita, Osaka 565-0871 Japan)
Nagao, Shijo; Suganuma, Katsuaki (The Institute of Scientific and Industrial Research, Osaka University, 8 - 1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan)
Albrecht, Hans-Juergen; Wilke, Klaus (Siemens AG, Corporate Technology, Siemensdamm 50, 13629 Berlin, Germany)

Inhalt:
Based on our previous research results, SiC-particle (SiC-p) added Ag sintering paste exhibits excellent high temperature reliability in Cu-Cu dummy bonding joints. Thus this paper explores the possibility of utilizing SiC-p added Ag paste as a novel high temperature die-attachment solution in actual situation. The bonding structure in this research is composed of Si dummy chips and a DBC (Direct bonded copper) substrate. Different additional amount (0~5%) of sub-micron SiC-p was added into a hybrid Ag paste in order to prepare a SiC-p/porous Ag compound structure. In earlier research, this structure had already exhibited stable cross-section morphology of both sintered Ag itself and of interfacial region. In addition to the Ag paste, the surface metallization of DBC substrate was also focused on in this research. Metallization was prepared separately by electroplating and sputtering and compared, and a Ti diffusion barrier layer was adopted. According to our results, SiC-p added Ag sintering paste shows better stability in extra-high temperature storage test and the Ti diffusion barrier layer plays an active role in the prevention of oxidation in ultra high temperature.