High-Current Power Cycling Test-Bench for Short Load Pulse Duration and First Results
Konferenz: PCIM Europe 2016 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
10.05.2016 - 12.05.2016 in Nürnberg, Deutschland
Tagungsband: PCIM Europe 2016
Seiten: 8Sprache: EnglischTyp: PDF
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Autoren:
Zeng, Guang; Herold, Christian; Beier-Moebius, Menia; Lutz, Josef (Chemnitz University of Technology, Reichenhainer Str. 70, 09126 Chemnitz, Germany)
Kubera, Sascha; Alvarez, Rodrigo (Siemens AG, Günther-Scharowsky-Str. 2, 91058 Erlangen, Germany)
Inhalt:
A power cycling test-bench for short load pulse duration in the millisecond range has been developed. This new setup with a cross regulator is in addition capable to test IGBTs and diodes of different manufacturers with the same desired combination of load pulse duration ton and junction temperature swing DeltaTj at the same time. Series of power cycling tests can be performed on this test-bench to build up new empirical lifetime models for IGBT modules. The focus lies on the impact of the short load pulse duration and small junction temperature swing on the power cycling capability.