SiC Improves Switching Losses, Power Density and Volume in UPS

Konferenz: PCIM Europe 2016 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
10.05.2016 - 12.05.2016 in Nürnberg, Deutschland

Tagungsband: PCIM Europe 2016

Seiten: 8Sprache: EnglischTyp: PDF

Persönliche VDE-Mitglieder erhalten auf diesen Artikel 10% Rabatt

Autoren:
Epp, Nikolai; Schulte-Overbeck, Christian; Cao, Zhiyu; Lemke, Michael; Heinemann, Lothar (AEG Power Solutions GmbH, Emil-Siepmann-Str.32, 59581 Warstein, Germany)

Inhalt:
The state-of-the-art transformerless uninterruptible power supplies (UPS) for the power rating from 50 kVA to hundreds of kVA are with silicon IGBT technology. In order to achieve high efficiency and good power quality, 3-level topology is state-of-the-art. Thanks to the significantly reduced switching losses of silicon carbide (SiC) semiconductors and the availability of high-current SiC metal-oxide-semiconductor field-effect transistor (MOSFET) module, a SiC-based UPS solution is more and more attractive for this power range. In this contribution a comparative study of Si-based and SiC-based UPS is presented first. For characterizing the new component, a test setup is developed. The test results, open issues and future works are discussed.