High reliability 600V High Voltage Integrated Circuit for Automotive applications

Konferenz: PCIM Asia 2016 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
28.06.2016 - 30.06.2016 in Shanghai, China

Tagungsband: PCIM Asia 2016

Seiten: 6Sprache: EnglischTyp: PDF

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Hitoshi, Makishima; Takeuchi, Takanobu; Yamamoto, Masahiro (Mitsubishi Electric Corporation, Japan)
Nobuo, Hashimoto; Tomoya, Yamano; Kyosuke, Yamamoto (Melco Semiconductor Engineering Corporation, Japan)

This paper presents a new high reliability 600V High Voltage Integrated Circuit (600V HVIC) for half bridge driver applications. It is suitable to drive Power MOSFET/IGBT for automotive aplications. The pin configurations and functions are compatible with the previous 600V HVIC for automotive applications. The high reliability is accomplished by using a new process.