Synchronous Observing Methodology of Surface Images and Energy Data at Power Chip Destruction

Inhalt:
Power devices suppliers are often required to analyze factors or reasons when failure occurred in the market. We usually use static analysis method; however some cases are hard to seek its true cause. This paper introduces dynamically observing method for IGBT destruction with ultrahigh speed camera. The system can capture its origin of the destruction and its ongoing status. It also takes synchronous data of voltage and current. Observed data at various situations and conditions will enable to get more precise estimation of the destruction cause and also incorporate a countermeasure at the initial design stage.