Influence of the Power Semiconductor Packaging on the Failure Characteristic for Safety-Critical Applications

Konferenz: PCIM Europe 2017 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
16.05.2017 - 18.05.2017 in Nürnberg, Deutschland

Tagungsband: PCIM Europe 2017

Seiten: 8Sprache: EnglischTyp: PDF

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Autoren:
Gleissner, Michael; Bakran, Mark-M. (University of Bayreuth, Germany)
Khalid, Hussein (Mitsubishi Electric Europe, Germany)

Inhalt:
The packaging of power semiconductors determines their failure characteristic. Wire-bonded modules fail with an undefined state reaching from not ideal short-circuit to explosion of the module depending on the failure energy. In contrast, an ideal short-on failure characteristic is known for presspack and sandwich structure modules. Safety-critical applications like the discharging of energy sources, e.g. fuel cells, require an ideal short-on failure characteristic. A minimum failure energy is necessary to reach this ideal failure state and a maximum failure energy must not be exceeded in order to avoid severe mechanical destruction. Therefore, the failure characteristic depending on packaging and energy is investigated by destruction tests.