Symbol Error Outage Performance Analysis of MCIK-OFDM over Complex TWDP Fading

Konferenz: European Wireless 2017 - 23th European Wireless Conference
17.05.2017 - 19.05.2017 in Dresden, Germany

Tagungsband: European Wireless 2017

Seiten: 5Sprache: EnglischTyp: PDF

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Luong, Thien Van; Ko, Youngwook (Institute of Electronics, Communications and Information Technology, Queen's University Belfast, UK)

This paper investigates the instantaneous symbol error outage probability (ISEOP) of a Multicarrier Index Keying with Orthogonal Frequency Division Multiplexing (MCIK-OFDM) system using greedy detection, over Two-Way with Diffused Power (TWDP) fading channels. The closed-form expressions for the upper and lower bound on the ISEOP are derived to analyze the effects of TWDP and MCIK parameters on the outage performance of MCIK-OFDM. Through the numerical analysis and asymptotic case studies, we provide a new insight on the performance of MCIK-OFDM in a complex wireless propagation environment such as in Device-to-Device (D2D) communications that face a variety of fading conditions.