Precise Voltage Measurement for Power Electronics with High Switching Frequencies

Konferenz: PCIM Europe 2018 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
05.06.2018 - 07.06.2018 in Nürnberg, Deutschland

Tagungsband: PCIM Europe 2018

Seiten: 6Sprache: EnglischTyp: PDF

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Nitzsche, Maximilian; Zehelein, Matthias; Troester, Nathan; Roth-Stielow, Joerg (Institute for Power Electronics and Electrical Drives, University of Stuttgart, Germany)

In this paper different approaches in precise measurement of gate voltages as well as drain-source voltages of modern SiC and GaN transistors are compared. An approach to calculate the necessary bandwidth of a voltage probe to reproduce the voltage slope is presented. Furthermore, state-ofthe- art voltage probes are compared in means of bandwidth, common mode reduction and response on EMI.