Characterization of H-field Probes regarding Unwanted Field Suppression using Different Calibration Structures
Konferenz: Smart Systems Integration - 13th International Conference & Exhibition on Integration Issues of Miniaturized Systems
10.04.2019 - 11.04.2019 in Barcelona, Spain
Tagungsband: SmartSystems Integration
Seiten: 4Sprache: EnglischTyp: PDF
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Autoren:
Schroeder, Dominik; Hangmann, Christian; Hedayat, Christian (Fraunhofer ENAS, Dept. ASE, Paderborn, Germany)
Otto, Thomas (Fraunhofer ENAS, Chemnitz, Germany)
Hilleringmann, Ulrich (University of Paderborn, Sensor Technology Group, Germany)
Inhalt:
In contrast to far-field measurements in a few meter distance, near-field measurements directly above a device allow a deeper and more detailed view on the electromagnetic behavior of a circuit. To obtain the correct field strength values from the measurement, it is essential that the probes are well characterized. An intrinsic property of an H-field probe is the capability to also capture E-fields. Hence, this paper presents a first approach to examine the so-called unwanted field suppression of near-field probes using the example of a tangential H-field probe of the NFS3000.