Fully automated measurement of losses on wide bandgap power semiconductors

Konferenz: PCIM Europe 2019 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
07.05.2019 - 09.05.2019 in Nürnberg, Deutschland

Tagungsband: PCIM Europe 2019

Seiten: 6Sprache: EnglischTyp: PDF

Persönliche VDE-Mitglieder erhalten auf diesen Artikel 10% Rabatt

Stracke, Daniel; Klee, Matthias; Schnabel, Fabian; Jung, Marco; Seibel, Axel (Fraunhofer Institute for Energy Economics and Energy System Technology IEE, Germany)

A test bench used for measuring switching energy and the conduction voltage of power semiconductors is presented. The system can vary its temperature, voltage, and current. Additionally, due to a special variable gate-driver-system, it is capable of adjusting the positive and negative gate voltages as well as the external gate resistance. The application software can configure a series of different tests by adjusting the test parameters. It supports the developer to find a suitable power semiconductor for a given power electronic design.