IGBT Failure Analysis in the Praxis

Konferenz: PCIM Asia 2019 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
26.06.2019 - 28.06.2019 in Shanghai, China

Tagungsband: PCIM Asia 2019

Seiten: 5Sprache: EnglischTyp: PDF

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Autoren:
Zhu, Dan (SEMIKRON Electronics (Zhuhai) Co., Ltd, China)

Inhalt:
IGBTs are more and more widely used in our life, from traditional application such as motor drives, inverter, UPS to renewable energy as wind power, solar energy to electric vehicles shuttling on the road. IGBT, like the heart of human body, occupies the most important position in the whole system and completes the conversion of electric energy. In the process of using it, we will inevitably encounter the problem of IGBT failure. How to analyze the problem, find the root cause and avoid the problem in the future application? Improving the reliability of the product has become a major topic for R&D engineers. This paper is written by a senior expert who has been engaging in IGBT failure analysis for more than ten years. She studied the advanced IGBT analysis methods both in China and internationally and systematically summarized and collated them in her work. The author of this paper is the Head of the Failure Analysis Center of SEMIKRON in Zhuhai.