Improved Double-Pulse Tests for Medium-Voltage Devices

Konferenz: PCIM Europe digital days 2020 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
07.07.2020 - 08.07.2020 in Deutschland

Tagungsband: PCIM Europe digital days 2020

Seiten: 6Sprache: EnglischTyp: PDF

Autoren:
Asam, Johann; Kell, Max-Josef; Mari, Jorge; Schroeder, Stefan; Schuetz, Tobias (Danfoss Silicon Power GmbH, Germany)

Inhalt:
It has been found that the turn-off behavior of medium voltage IGBTs changes significantly with the duration that the device was turned on before the turn-off event. When the duration of actual pulses are close to the minimum conduction-time (typically 10mus), this effect is most pronounced. However, this effect is still visible for significantly longer pulses (>100mus). In this paper, it will be explained how this effect has been found during “normal” double-pulse tests. Then it will be shown how this effect can be systematically analyzed and quantified using an adapted double pulse test.