Multilevel Gate Driver with Adjustable Gate Voltage for Thermal Stress Reduction of Power Switches in Electric Drive Application

Konferenz: PCIM Europe digital days 2020 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
07.07.2020 - 08.07.2020 in Deutschland

Tagungsband: PCIM Europe digital days 2020

Seiten: 8Sprache: EnglischTyp: PDF

Autoren:
Wang, Lie; Vermulst, Bas; Duarte, Jorge (Eindhoven University of Technology, The Netherlands)

Inhalt:
Due to varying load currents, the junction temperature variations of power switches causes thermal stress and compromises lifetime. In this paper, proper gate voltage control is used for all power switches in a three-phase electric drive to smooth the profile of conduction losses, therefore reducing thermal stress. A gate driver with adjustable multilevel gate voltage is introduced and experimentally verified for the thermal control method. The switch lifetime is estimated at last, which indicates an improvement by a factor of two.