Using Near Field Probes in Electronic Circuits
Konferenz: PCIM Europe 2022 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
10.05.2022 - 12.05.2022 in Nürnberg, Germany
doi:10.30420/565822011
Tagungsband: PCIM Europe 2022
Seiten: 9Sprache: EnglischTyp: PDF
Autoren:
Mediano, Arturo (Department of Electronic Engineering and Communications, I3A, University of Zaragoza, Spain)
Inhalt:
Electric and magnetic near-field probes (NFPs) are very useful and valuable tools for measuring and debugging electronic circuits. They have been used from many years ago by RF engineers and for EMI/EMC debugging. In this paper a short review of near field probes and how useful they are for measuring in electronics is included. We explain what a near field probe is, the difference between magnetic and electric near field probes, and several examples to demonstrate their use in EMI debugging and current/voltage non-invasive measurements.