Microgrid Reliability Assessment Based on Historical Weather Conditions

Konferenz: PCIM Asia 2022 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
26.10.2022 - 27.10.2022 in Shanghai, China

Tagungsband: PCIM Asia 2022

Seiten: 5Sprache: EnglischTyp: PDF

Autoren:
Chai, Xiaoguang; Chen, Ming; Zong, Shaolei; Liu, Zhong; Yang, Guangzhong (Wuxi Power Supply Company of State Grid, China)
Guo, Fancheng (Nantong Power Supply Company of State Grid, China)

Inhalt:
Microgrid technology is helpful for the power grid to accept distributed generation (DG), and improve the power supply quality and reliability of the network. Power converters in microgrid are the core devices for connecting various forms of energy. In this paper, the reliability of microgrid is analyzed based on the lifetime estimation of power electronic devices. Among them, the historical weather data is used to analyze the output and power loss of various forms of DG generation. Based on the power loss and the established IGBT thermoelectric model, the junction temperature curve is obtained, and finally the reliability of the converter in the microgrid is analyzed according to the junction temperature.