Device Model of CSTBT with Highly Dosed Carrier Density in CS Layer

Konferenz: PCIM Europe 2023 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
09.05.2023-11.05.2023 in Nürnberg, Germany

doi:10.30420/566091306

Tagungsband: PCIM Europe 2023

Seiten: 5Sprache: EnglischTyp: PDF

Autoren:
Tadakuma, Toshiya; Joko, Motonobu (Mitsubishi Electric Corporation, Japan)
He, Daniel; Stumpf, Eugen (Mitsubishi Electric Europe B.V., Germany)

Inhalt:
This paper proposes an IGBT(CSTBT) model based on a physical model, for circuit simulation that is widely applied in inverters for motor control. The target CSTBT has highly dosed electron density in carrier stored N layer (CS layer) and highly effects on turn-on operation faster. The model is based on MOSFET and PiN Diode with voltage dependent capacitances (CCG and CCE) and constant CGE and is featured that a dynamical phenomenon which hole as carrier stored in CS layer around gate structure conducts steeply through channel is expressed by a structure consisted of a capacitor at drain part of MOSFET and an imaginary power supply with switch. And the proposed model is validated by compar-ison between simulation and actual measurement of current dependencies of switching losses and speeds.