Machine Learning and Digital Twins for RUL Prediction of DC Semiconductor Circuit Breakers
Konferenz: PCIM Conference 2025 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
06.05.2025 - 08.05.2025 in Nürnberg, Germany
doi:10.30420/566541026
Tagungsband: PCIM Conference 2025
Seiten: Sprache: EnglischTyp: PDF
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Autoren:
Koehler, Lena; Roeder, Georg; Messinger, Marco; Drexler, Kilian; Schellenberger, Martin; Wagner, Johann; Rusakova, Anna; Amoli, Noopur; Lorentz, Vincent R. H.
Inhalt:
Direct current (DC) Semiconductor Circuit Breakers (SCCBs) are considered as enablers for the further integration of DC systems. Although the reliability of these devices is of crucial importance, conventional testing and lifetime prediction lack the consideration of operating conditions in field application and realtime remaining useful life (RUL) prediction. Within this paper a new approach employing a digital twin enabling digital services for degradation indicator-based RUL prediction using machine learning (ML) is presented and results of a base model implementation for RUL prediction are discussed. In addition, the concept for a novel setup for testing the new services with real world mission profiles is presented.