Short-Circuit Behavior of Quasi Series Connected SiC-MOSFETs: Measurements and Simulative Validation
Konferenz: PCIM Conference 2025 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
06.05.2025 - 08.05.2025 in Nürnberg, Germany
doi:10.30420/566541045
Tagungsband: PCIM Conference 2025
Seiten: Sprache: EnglischTyp: PDF
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Autoren:
Baeumler, Christian; Gesele, Felix; Basler, Thomas; Brueckner, Thomas
Inhalt:
In topologies with three active switches within a commutation loop, a failure of one device can lead to a combined short-circuit situation of quasi-serial switches. This paper, inspired by measurement results on state-of-the-art 3.3 kV SiC half-bridge modules, presents a comprehensive study that contributes additional explanations and discusses the influence of intrinsic packaging parameters beyond the possibilities of measurement. By utilizing a customized simulation model, the voltage distribution for arbitrary shortcircuit combinations is derived. Moreover, different parameter variations are judged concerning higher short-circuit robustness and, coincidentally, minimum impact on the normal operation.