Zth-Scope: Thermal Impedance Measurement System for Power Semiconductors with Variable Sample Time
Konferenz: PCIM Conference 2025 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
06.05.2025 - 08.05.2025 in Nürnberg, Germany
doi:10.30420/566541161
Tagungsband: PCIM Conference 2025
Seiten: Sprache: EnglischTyp: PDF
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Autoren:
Fuchs, Paul; Fuhrmann, Jan; Heise, Tobias; Eckel, Hans-Guenter
Inhalt:
This paper presents a novel device for measuring the transient thermal impedance of power semiconductors, called the zth-scope. Containing a high-speed Analog-to-Digital Converter and also being responsible for controlling auxiliary switches via fibre-optics, it facilitates such a measurement noticeably, compared to usual setups. It also features a touch display for showing measurement data and controlling measurements easily. A detailed overview of the system design process is given and also an example measurement of a high-power semiconductor module is presented and discussed.