Analysis of Threshold Voltage Hysteresis on Switching Speed of SiC MOSFET with Kelvin and Non-Kelvin Packages

Konferenz: PCIM Conference 2025 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
06.05.2025 - 08.05.2025 in Nürnberg, Germany

doi:10.30420/566541205

Tagungsband: PCIM Conference 2025

Seiten: Sprache: EnglischTyp: PDF

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Autoren:
Yuan, Ziheng; Li, Helong; Yang, Man Zhang Zhiqing; Zhao, Shuang; Ding, Lijian

Inhalt:
Silicon carbide (SiC) MOSFETs feature threshold voltage (VTH) hysteresis due to the high trap density at SiC/SiO2 interface. This paper investigates the effect of VTH hysteresis on the switching speed of SiC MOSFETs with Kelvin and non-Kelvin packages. It reveals that the non-Kelvin packaged devices exhibit larger current rise time variations (Deltatir) and turn-on losses variations (DeltaEon) under the same VTH hyste-resis compared to Kelvin counterparts. Moreover, Deltatir and DeltaEon is positively correlated with the common-source inductance (LCS), which further improves the sensitivity of the tir to VTH hysteresis of non-Kelvin packaged device. The above conclusions are confirmed by the double pulse tests.