Lifetime Testing and In-Situ Condition Monitoring of PCB Embedded Silicon Carbide MOSFETs
Konferenz: PCIM Conference 2025 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
06.05.2025-08.05.2025 in Nürnberg, Germany
doi:10.30420/566541344
Tagungsband: PCIM Conference 2025
Seiten: 6Sprache: EnglischTyp: PDF
Autoren:
Strahringer, David; Quay, Ruediger; Ladentin, Kevin; Chen, Jue; Neumann, Alexander
Inhalt:
This work explains step by step how to realize a setup for lifetime testing using active power cycling for power transistors with a special focus on PCB-embedded SiC-MOSFETs. For further analysis of the health status of the module, in-situ condition monitoring in form of acoustic emission testing is used for a better understanding of the failure mechanisms.