Estimation of Power Semiconductor Junction Temperature from Package Body Temperatures
Konferenz: PCIM Asia New Delhi - The Agent of Change for the Indian Power Electronics Industry
09.12.2025-10.12.2025 in Dr. Ambedkar International Centre, New Delhi, India
doi:10.30420/566677031
Tagungsband: PCIM Asia New Delhi
Seiten: 5Sprache: EnglischTyp: PDF
Autoren:
Vo, Dennis; Palaniappan, Dinesh; Wai Ma, Kwok; Seng, Philipp
Inhalt:
Measurement of power semiconductor operation junction temperature TJ is an essential part of power converters design, but it is not a straightforward task. This paper proposes a novel and easy to use approach by measuring temperatures on epoxy mold body of discrete power semiconductors to estimate TJ. A simplified thermal model is built to establish the relationship between different temperature points of interest. Finite element analysis (FEA) simulations are used to determine the correlation model parameters and then thermal measurements using infra-red (IR) camera are performed to confirm and validate the accuracy of the proposed method.

