1
Ionosphere Perturbation Effects in Repeated Orbits SAR Interferometry
Authors:
Zakharov, Alexander
Conference:
EUSAR 2008 - 7th European Conference on Synthetic Aperture Radar
2
Ionospheric Correction by Means of Coherent Scatterers
Authors:
Zandoná-Schneider, Rafael; Papathanassiou, Konstantinos
Conference:
EUSAR 2008 - 7th European Conference on Synthetic Aperture Radar
3
IPEM-Based Power Electronics System Integration
Authors:
Boroyevich, Dushan; Fred. C. Lee; Wyk, J. Daan van; Lu, Guo-Quan; Scott, Elaine P.; Xu, Ming; Burgos, Rolando; Wang, Fred; Jahns, Thomas M.; Lipo, Thomas A.; Lorenz, Robert D.; Chow, T. Paul
Conference:
CIPS 2008 - 5th International Conference on Integrated Power Electronics Systems
4
ISAR Data Dynamics:Target Shapes Features Extraction for the design of ISAR Retrieval System
Authors:
Saidi, Mohamed Nabil; Saidi, Mohamed Nabil; Toumi, Abdelmalek; Hoeltzener, Brigitte; Khenchaf, Ali; Aboutajdine, Driss
Conference:
EUSAR 2008 - 7th European Conference on Synthetic Aperture Radar
5
Issues and Options for Planar Packaging of High-Voltage SiC Diodes
Authors:
Xu, Jing; Ngo, Khai D. T.; Calata, Jess; Wyk, J. D. van; Wyk, J. D. van
Conference:
CIPS 2008 - 5th International Conference on Integrated Power Electronics Systems
6
Ist die EMV sicherheitsrelevanter Geräte nach bestandenen Störfestigkeitsnachweisen gewährleistet?
Authors:
Vick, Ralf
Conference:
EMV 2008 - Internationale Fachmesse und Kongress für Elektromagnetische Verträglichkeit
7
IT-Security in der Prozessumgebung – Ansätze in der praktischen Anwendung
Authors:
Jensen, Ingo
Conference:
Schutz- und Leittechnik 2008 - 3. ETG-/BDEW-Tutorial
8
IT-Sicherheit in der Stationsautomatisierung – Lösungsansätze aus IDS-Sicht
Authors:
Schweitzer, Dietmar
Conference:
Schutz- und Leittechnik 2008 - 3. ETG-/BDEW-Tutorial
9
Iterative decoding of product block codes based on the genetic algorithms
Authors:
Belkasmi, Mostafa; Berbia, Hassan; Bouanani, Faissal El
Conference:
SCC'08 - 7th International ITG Conference on Source and Channel Coding
10
Iterative Detection for Spatial Multiplexing with Adaptive Power Allocation
Authors:
Ahrens, Andreas; Kühn, Volker; Weber, Tobias
Conference:
SCC'08 - 7th International ITG Conference on Source and Channel Coding
11
Iterative Estimation and Cancellation of Clipping Noise for Multi-Layer IDMA Systems
Authors:
Hao, Dapeng; Hoeher, Peter Adam
Conference:
SCC'08 - 7th International ITG Conference on Source and Channel Coding
12
Iterative Near-optimal Decoder for STBC from CIOD over Time-Varying Channel
Authors:
Nam, Eunhye; Lee, Namjeong; Lee, Keonkook; Kang, Joonhyuk; Kim, Youngok
Conference:
European Wireless 2008 - 14th European Wireless Conference
13
Iterative Source-Channel Decoding: Design of Redundant Index Assignments
Authors:
Clevorn, Thorsten; Schmalen, Laurent; Vary, Peter; Adrat, Marc
Conference:
Sprachkommunikation 2008 - 8. ITG-Fachtagung
14
Joint Network/Channel Coding for Multi-User Hybrid-ARQ
Authors:
Thobaben, Ragnar
Conference:
SCC'08 - 7th International ITG Conference on Source and Channel Coding
15
Joint Spatial and Temporal PAR Reduction in MIMO OFDM
Authors:
Siegl, Christian; Fischer, Robert F. H.
Conference:
SCC'08 - 7th International ITG Conference on Source and Channel Coding
16
JTAG / Boundary Scan vs. In-Circuit Test
Authors:
Berger, Mario
Conference:
Elektronische Baugruppen und Leiterplatten - EBL 2008 - Systemintegration und Zuverlässigkeit - 4. DVS/GMM-Fachtagung
17
Ka-Band SAR for Spaceborne Applications based on Scan-on- Receive Techniques
Authors:
Ludwig, Michael; D'Addio, Salvatore; Saameno-Perez, Paula
Conference:
EUSAR 2008 - 7th European Conference on Synthetic Aperture Radar
18
Kardiorespiratorisch überwachtes Schlafen und Sitzen
Authors:
Rombach, Christian; Schönegg, Martin; Bolz, Armin
Conference:
Ambient Assisted Living - AAL - 1. Deutscher AAL-Kongress mit Ausstellung / Technologien - Anwendungen - Management
19
Key improvement Schemes of Accuracies in EB Mask Writing for Double Patterning Lithography
Authors:
Sunaoshi, Hitoshi; Kamikubo, Takashi; Nishimura, Rieko; Tsuruta, Kaoru; Katsumata, Takehiko; Ohnishi, Takayuki; Anze, Hirohito; Takamatsu, Jun; Yoshitake, Shusuke; Tamamushi, Shuichi
Conference:
EMLC 2008 - 24th European Mask and Lithography Conference
20
Klima- und Betauungstest in der BMW Group für Baugruppen
Authors:
Thierauf, Jean
Conference:
Systemintegration in der Mikroelektronik - SMT/HYBRID/PACKINGING 2008, Fertigung elektronischer Baugruppen für die Automobilelektronik; Messe und Kongress