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IEC 62526:2007

Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

Ausgabedatum: 2007-11
Edition: 1.0
Sprache: EN - englisch
Seitenzahl: 123 VDE-Artnr.: 214023

Inhaltsverzeichnis

Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.