Cover IEC 60444-11:2010
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IEC 60444-11:2010

Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction

Ausgabedatum: 2010-10
Edition: 1.0
Sprache: EN-FR - zweisprachig englisch/französisch
Seitenzahl: 28 VDE-Artnr.: 217564

Inhaltsverzeichnis

IEC 60444-11:2010 defines the standard method of measuring load resonance frequency fL at the nominal value of CL, and the determination of the effective load capacitance CLeff at the nominal frequency for crystals with the figure of merit M > 4.