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IEC 60444-6:2021

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)

150,00 € 

IEC 60444-6:2021 RLV

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)

195,00 € 

IEC 60444-8:2016

Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units

80,00 € 

IEC 60444-11:2010

Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction

80,00 € 

IEC 60444-9:2007

Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units

80,00 € 

IEC 60444-7:2004

Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units

20,00 € 

IEC 60444-1:1986/AMD1:1999

Amendment 1 - Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network

20,00 € 

IEC 60444-5:1995

Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction

270,00 € 

IEC TR 60444-4:1988

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz

80,00 € 

IEC 60444-1:1986

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network

150,00 € 

IEC 60444-2:1980

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units

40,00 €