Cover IEC 61788-15:2011

IEC 61788-15:2011

Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies

Ausgabedatum: 2011-10
Edition: 1.0
Sprache: EN-FR - zweisprachig englisch/französisch
Seitenzahl: 96 VDE-Artnr.: 218340


IEC 61788-15:2011 describes measurements of the intrinsic surface impedance (Zs) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method. The object of measurement is to obtain the temperature dependence of the intrinsic Zs at the resonant frequency f0.