IEC TR 63133:2017
Semiconductor devices - Scan based ageing level estimation for semiconductor devices
Ausgabedatum:
2017-10
Edition:
1.0
Sprache: EN - englisch
Seitenzahl: 17 VDE-Artnr.: 225041
IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.