IEC 62047-5:2011Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
235,00 €
|
IEC 62047-9:2011Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS
150,00 €
|
IEC 62047-7:2011Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
190,00 €
|
|
IEC 60747-16-4:2004+AMD1:2009 CSV (Consolidated Version)Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
270,00 €
|
IEC 62047-8:2011Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films
115,00 €
|
IEC 60747-15:2010Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
150,00 €
|
IEC 62374-1:2010Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
80,00 €
|
IEC TR 62258-3:2010Semiconductor die products - Part 3: Recommendations for good practice in handling, packing and storage
300,00 €
|
IEC 60747-16-3:2002+AMD1:2009 CSV (Consolidated Version)Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
335,00 €
|
IEC 60747-14-3:2009Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors
115,00 €
|
IEC 62047-6:2009Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials
80,00 €
|
|
IEC 60747-16-3:2002/AMD1:2009Amendment 1 - Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
20,00 €
|
IEC 60747-16-4:2004/AMD1:2009Amendment 1 - Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
20,00 €
|
IEC 62047-4:2008Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS
115,00 €
|
IEC TR 62258-8:2008Semiconductor die products - Part 8: EXPRESS model schema for data exchange
190,00 €
|
|
IEC 62374:2007Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films
150,00 €
|
IEC 60747-16-1:2001+AMD1:2007 CSV (Consolidated Version)Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
485,00 €
|