Anzeige
Sortierung
Seite 6 von 7

IEC 60747-16-5:2013

Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators

280,00 € 

IEC TR 62258-4:2012

Semiconductor die products - Part 4: Questionnaire for die users and suppliers

115,00 € 

IEC 62047-5:2011/COR1:2012

Corrigendum 1 - Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches

0,00 € 

IEC 62047-9:2011/COR1:2012

Corrigendum 1 - Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS

0,00 € 

IEC 62047-13:2012

Semiconductor devices - Micro-electromechanical devices - Part 13: Bend - and shear - type test methods of measuring adhesive strength for MEMS structures

80,00 € 

IEC 62047-14:2012

Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials

115,00 € 

IEC 62047-10:2011/COR1:2012

Corrigendum 1 - Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials

0,00 € 

IEC 62047-12:2011

Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures

200,00 € 

IEC 62047-10:2011

Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials

40,00 € 

IEC 62047-5:2011

Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches

249,99 € 

IEC 62047-9:2011

Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS

155,00 € 

IEC 62047-7:2011

Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection

200,00 € 

IEC 62258-2:2011

Semiconductor die products - Part 2: Exchange data formats

365,00 € 

IEC 60747-16-4:2004+AMD1:2009 CSV (Consolidated Version)

Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches

375,00 € 

IEC 62047-8:2011

Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films

115,00 € 

IEC 62374-1:2010

Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

80,00 € 

IEC TR 62258-3:2010

Semiconductor die products - Part 3: Recommendations for good practice in handling, packing and storage

320,00 € 

IEC 60747-16-3:2002+AMD1:2009 CSV (Consolidated Version)

Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters

465,00 € 

IEC 60747-14-3:2009

Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors

115,00 € 

IEC 62047-6:2009

Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials

80,00 €