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IEC 62047-7:2011

Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection

185,00 € 

IEC 62258-2:2011

Semiconductor die products - Part 2: Exchange data formats

330,00 € 

IEC 60747-16-4:2004+AMD1:2009 CSV (Consolidated Version)

Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches

265,00 € 

IEC 62047-8:2011

Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films

115,00 € 

IEC 60747-15:2010

Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices

150,00 € 

IEC 62374-1:2010

Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

75,00 € 

IEC TR 62258-3:2010

Semiconductor die products - Part 3: Recommendations for good practice in handling, packing and storage

290,00 € 

IEC 60747-16-3:2002+AMD1:2009 CSV (Consolidated Version)

Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters

320,00 € 

IEC 60747-14-3:2009

Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors

115,00 € 

IEC 62047-6:2009

Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials

75,00 € 

IEC 62258-1:2009

Semiconductor die products - Part 1: Procurement and use

260,00 € 

IEC 60747-16-3:2002/AMD1:2009

Amendment 1 - Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters

20,00 € 

IEC 60747-16-4:2004/AMD1:2009

Amendment 1 - Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches

20,00 € 

IEC 62047-4:2008

Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS

115,00 € 

IEC TR 62258-8:2008

Semiconductor die products - Part 8: EXPRESS model schema for data exchange

185,00 € 

IEC TR 62258-7:2007

Semiconductor die products - Part 7: XML schema for data exchange

185,00 € 

IEC 62374:2007

Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films

150,00 € 

IEC 60747-16-1:2001+AMD1:2007 CSV (Consolidated Version)

Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

520,00 € 

IEC 60747-16-1:2001/AMD1:2007

Amendment 1 - Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

115,00 € 

IEC 62258-5:2006

Semiconductor die products - Part 5: Requirements for information concerning electrical simulation

75,00 €