IEC 60747-16-1:2001/AMD1:2007

Amendment 1 - Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

IEC 62258-5:2006

Semiconductor die products - Part 5: Requirements for information concerning electrical simulation

IEC 62258-6:2006

Semiconductor die products - Part 6: Requirements for information concerning thermal simulation

IEC 62047-2:2006

Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials

IEC 62047-3:2006

Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing

IEC 61967-2:2005

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method

IEC 60747-16-4:2004

Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches

IEC 60747-16-3:2002

Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters

IEC 60747-16-1:2001

Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

IEC 60747-14-2:2000

Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements

IEC 60146-2:1999

Semiconductor converters - Part 2: Self-commutated semiconductor converters including direct d.c. converters