IEC 60749-8:2002

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

IEC 60749-1:2002

Semiconductor devices - Mechanical and climatic test methods - Part 1: General

IEC 60749-11:2002

Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method

IEC 60749-2:2002

Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure