IEC 60749-1:2002
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Ausgabedatum:
2002-08
Edition:
1.0
Sprache: EN-FR - zweisprachig englisch/französisch
Seitenzahl: 15 VDE-Artnr.: 210114
Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.