Efficient Condition Monitoring with Si-DMS and RFID Technology: An Autonomous RF-based Surface-Mountable Measurement System
Konferenz: MikroSystemTechnik KONGRESS 2025 - Mikroelektronik/Mikrosystemtechnik und ihre Anwendungen – Nachhaltigkeit und Technologiesouveränität
27.10.2025-29.10.2025 in Duisburg, Germany
doi:10.30420/456614093
Tagungsband: MikroSystemTechnik Kongress 2025
Seiten: 2Sprache: EnglischTyp: PDF
Autoren:
Frank, Thomas; Hermann, Stefan; Gruen, Andre; Kermann, Manuel; Hintz, Michael; Cyriax, Andrea; Ettrich, Klaus; Peitsch, Peter; Kahl, Sebastian
Inhalt:
Condition monitoring of structures and machinery is becoming increasingly important to detect wear or damage early and prevent unplanned failures. A proven method is measuring mechanical strain at exposed positions. The presented system combines visual inspections and automatic monitoring with highly sensitive silicon strain sensors (Si-DMS) and RFID technology.