Cover IEC 60749-24:2004
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IEC 60749-24:2004

Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST

Ausgabedatum: 2004-03
Edition: 1.0
Sprache: EN-FR - zweisprachig englisch/französisch
Seitenzahl: 19 VDE-Artnr.: 212399

Inhaltsverzeichnis

The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.