IEC 62951-2:2019
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices
Ausgabedatum:
2019-04
Edition:
1.0
Sprache: EN-FR - zweisprachig englisch/französisch
Seitenzahl: 21 VDE-Artnr.: 247362
IEC 62951-2:2019 specifies terms, definitions, symbols, configurations and evaluation methods that can be used to evaluate and determine the performance characteristics of flexible thin-film transistor (TFT) devices. This document specifies test methods and characteristic parameters for accurately evaluating the performance and reliability in practical use of flexible TFT devices under the bending status.