IEC 62951-6:2019
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
Ausgabedatum:
2019-05
Edition:
1.0
Sprache: EN-FR - zweisprachig englisch/französisch
Seitenzahl: 50 VDE-Artnr.: 247622
IEC 62951-6:2019 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.