Cover IEC TR 61189-5-506:2019
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IEC TR 61189-5-506:2019

Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 5-506: General test methods for materials and assemblies - An intercomparison evaluation to implement the use of fine-pitch test structures for surface insulation resistance (SIR) testing of solder fluxes in accordance with IEC 61189-5-501

Ausgabedatum: 2019-06
Edition: 1.0
Sprache: EN - englisch
Seitenzahl: 23 VDE-Artnr.: 247783

Inhaltsverzeichnis

IEC TR 61189-5-506:2019(E) is an intercomparison supporting the development of IEC 61189-5-501 in relation to the SIR method. This document sets out to validate the introduction of a new 200-æm gap SIR pattern, and was benched marked against existing SIR gap patterns of 318 æm and 500 æm.