Cover IEC 61189-5-503:2017

IEC 61189-5-503:2017

Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards

Ausgabedatum: 2017-05
Edition: 1.0
Sprache: EN-FR - zweisprachig englisch/französisch
Seitenzahl: 47 VDE-Artnr.: 248043


IEC 61189-5-503:2017 specifies the conductive anodic filament (hereafter referred to as CAF) and specifies not only the steady-state temperature and humidity test, but also a temperature-humidity cyclic test and an unsaturated pressurized vapour test (HAST).