IEC 60747-16-5:2013/AMD1:2020/COR1:2020Corrigendum 1 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
0,00 €
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IEC 60747-16-5:2013/AMD1:2020Amendment 1 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
20,00 €
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IEC 60747-16-5:2013+AMD1:2020 CSV (Consolidated Version)Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
515,00 €
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IEC 63068-3:2020Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence
200,00 €
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IEC 62047-37:2020Semiconductor devices - Micro-electromechanical devices - Part 37: Environmental test methods of MEMS piezoelectric thin films for sensor application
115,00 €
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IEC 60747-5-10:2019Semiconductor devices - Part 5-10: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the room-temperature reference point
80,00 €
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IEC 60747-5-9:2019Semiconductor devices - Part 5-9: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence
115,00 €
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IEC 60747-5-11:2019Semiconductor devices - Part 5-11: Optoelectronic devices - Light emitting diodes - Test method of radiative and nonradiative currents of light emitting diodes
80,00 €
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IEC 60747-18-3:2019Semiconductor devices - Part 18-3: Semiconductor bio sensors - Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
155,00 €
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IEC 60747-19-1:2019Semiconductor devices - Part 19-1: Smart sensors - Control scheme of smart sensors
155,00 €
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IEC 62047-35:2019Semiconductor devices - Micro-electromechanical devices - Part 35: Test method of electrical characteristics under bending deformation for flexible electro-mechanical devices
155,00 €
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IEC 60747-5-8:2019Semiconductor devices - Part 5-8: Optoelectronic devices - Light emitting diodes - Test method of optoelectronic efficiencies of light emitting diodes
115,00 €
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IEC 62830-6:2019Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 6: Test and evaluation methods for vertical contact mode triboelectric energy harvesting devices
155,00 €
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IEC 60747-16-6:2019Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers
155,00 €
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IEC 60747-18-1:2019Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors
200,00 €
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IEC 63150-1:2019Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 1: Arbitrary and random mechanical vibrations
249,99 €
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IEC 62951-6:2019Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
155,00 €
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IEC 62951-2:2019Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices
40,00 €
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IEC 62047-31:2019Semiconductor devices - Micro-electromechanical devices - Part 31: Four-point bending test method for interfacial adhesion energy of layered MEMS materials
80,00 €
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IEC 62047-33:2019Semiconductor devices - Micro-electromechanical devices - Part 33: MEMS piezoresistive pressure-sensitive device
155,00 €
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