Cover IEC 62969-4:2018

IEC 62969-4:2018

Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors

Ausgabedatum: 2018-06
Edition: 1.0
Sprache: EN-FR - zweisprachig englisch/französisch
Seitenzahl: 39 VDE-Artnr.: 225745


IEC 62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface.